Investigation of structural and optical properties of sputtered Zirconia thin filmsF. Rebib, N. Laidani, G. Gottardi, V. Micheli, R. Bartali, Y. Jestin, E. Tomasella, M. Ferrari and L. ThomasEur. Phys. J. Appl. Phys., 43 3 (2008) 363-368DOI: https://doi.org/10.1051/epjap:2008129