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Electrical measurements of nanoscale bismuth cluster films

M. Schulze, S. Gourley, S. A. Brown, A. Dunbar, J. Partridge and R. J. Blaikie

Eur. Phys. J. D, 24 1-3 (2003) 291-294

DOI: https://doi.org/10.1140/epjd/e2003-00144-3

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