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Extreme-ultraviolet emissivity from Xe⁸⁺ to Xe¹²⁺ by using a detailed line-by-line method

J. Zeng, C. Gao and J. Yuan

Eur. Phys. J. D, 60 2 (2010) 309-316

DOI: https://doi.org/10.1140/epjd/e2010-00192-6

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