Atomistic studies of helium trapping and diffusion at Ni–graphene interfacesHai Huang, Xiaoxin Ge, Xu Yu, Yanxin Jiang and Qing PengEur. Phys. J. Plus, 140 6 (2025) 497DOI: https://doi.org/10.1140/epjp/s13360-025-06447-1