Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
M.-I. Richard, N. A. Katcho, M. G. Proietti, H. Renevier, V. Favre-Nicolin, Z. Zhong, G. Chen, M. Stoffel, O. Schmidt, G. Renaud, T. U. Schülli and G. Bauer