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A simultaneous multiwavelength dispersive X-ray reflectometer for time-resolved reflectometry

T. Matsushita, E. Arakawa, Y. Niwa, Y. Inada, T. Hatano, T. Harada, Y. Higashi, K. Hirano, K. Sakurai, M. Ishii and M. Nomura

Eur. Phys. J. Special Topics, 167 (2009) 113-119

DOI: https://doi.org/10.1140/epjst/e2009-00945-4

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