Depth-resolved magnetization distribution in ultra thin films by soft X-ray resonant magnetic reflectivityJ.-M. Tonnerre, E. Jal, E. Bontempi, N. Jaouen, M. Elzo, S. Grenier, H.L. Meyerheim and M. PrzybylskiEur. Phys. J. Special Topics, 208 (2012) 177-187DOI: https://doi.org/10.1140/epjst/e2012-01618-y