EPJ

Scaling relationship between effective critical exponents throughout the crossover region in thin Ising films

M. I. Marqués and J. A. Gonzalo

Eur. Phys. J. B, 14 2 (2000) 317-321

Published online: 15 March 2000

DOI: 10.1007/s100510050135

M. I. Marqués

J. A. Gonzalo

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