EPJ

Interfacial roughness in a near-critical binary fluid mixture: X-ray reflectivity and near-specular diffuse scattering

B. R. McClain, M. Yoon, J. D. Litster and S. G.J. Mochrie

Eur. Phys. J. B, 10 1 (1999) 45-52

Published online: 15 July 1999

DOI: 10.1007/s100510050828

B. R. McClain

M. Yoon

J. D. Litster

S. G.J. Mochrie

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