EPJ

Effective scaling behavior of magnetization and Hamming distance in Ising thin films under a surface field

E.M. de Sousa Luz, A. F. Siqueira, U. M.S. Costa and M. L. Lyra

Eur. Phys. J. B, 12 1 (1999) 115-118

Published online: 15 November 1999

DOI: 10.1007/s100510050984

E.M. de Sousa Luz

A. F. Siqueira

U. M.S. Costa

M. L. Lyra

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