EPJ

In situ X-ray diffraction investigation of porous silicon strains induced by the freezing of a confined organic fluid

C. Faivre, D. Bellet and G. Dolino

Eur. Phys. J. B, 16 3 (2000) 447-454

Published online: 15 August 2000

DOI: 10.1007/s100510070202

C. Faivre

D. Bellet

G. Dolino

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