EPJ

Influence of acceptor impurities on semi-insulating GaAs particle detectors

R. Ferrini, G. Guizzetti, M. Patrini, F. Nava, P. Vanni and C. Lanzieri

Eur. Phys. J. B, 16 2 (2000) 213-216

Published online: 15 July 2000

DOI: 10.1007/s100510070221

R. Ferrini

G. Guizzetti

M. Patrini

F. Nava

P. Vanni

C. Lanzieri

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)