EPJ

Electrical properties and Kerr effect study of evaporated Fe/Si and Fe/glass thin films

B. Ghebouli, A. Layadi, A. Guittoum, L. Kerkache, M. Benkerri, A. Klimov, V. Preobrazhensky and P. Pernod

Eur. Phys. J. Appl. Phys., 48 3 (2009) 30503

Published online: 30 October 2009

DOI: 10.1051/epjap/2009183

B. Ghebouli

A. Layadi

A. Guittoum

L. Kerkache

M. Benkerri

A. Klimov

V. Preobrazhensky

P. Pernod

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