EPJ

Nanotomography of electrical contacts – new insights by high resolution 3D analysis of local material degradation

N. Jeanvoine, A. Velichko, C. Selzner and F. Mücklich

Eur. Phys. J. Appl. Phys., 49 2 (2010) 22907

Published online: 22 December 2009

DOI: 10.1051/epjap/2009210

N. Jeanvoine

A. Velichko

C. Selzner

F. Mücklich

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