EPJ

Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy

C. Riedel, R. Arinero, Ph. Tordjeman, M. Ramonda, G. Lévêque, G. A. Schwartz, D. G. de Oteyza, A. Alegría and J. Colmenero

Eur. Phys. J. Appl. Phys., 50 1 (2010) 10501

Published online: 26 February 2010

DOI: 10.1051/epjap/2010010

C. Riedel

R. Arinero

Ph. Tordjeman

M. Ramonda

G. Lévêque

G. A. Schwartz

D. G. de Oteyza

A. Alegría

J. Colmenero

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