EPJ

Novel MgO/SiO₂ double protective layers to prevent Ag mirror degradation

S.-J. Choi, K.-H. Kim, J.-H. Jo, S.-J. Kwon, S. Cho and H. Oh

Eur. Phys. J. Appl. Phys., 51 1 (2010) 10501

Published online: 17 June 2010

DOI: 10.1051/epjap/2010063

S.-J. Choi

K.-H. Kim

J.-H. Jo

S.-J. Kwon

S. Cho

H. Oh

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