EPJ

Positive corona discharge ion source with IMS/MS to detect impurities in high purity Nitrogen

M. Sabo, M. Klas, H. Wang, C. Huang, Y. Chu and Š. Matejčík

Eur. Phys. J. Appl. Phys., 55 1 (2011) 13808

Published online: 21 July 2011

DOI: 10.1051/epjap/2011100437

M. Sabo

M. Klas

H. Wang

C. Huang

Y. Chu

Š. Matejčík

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