EPJ

Effect of point defects on lattice constant in MgO thin film deposited on silicon(0 0 1) substrate - Ab initio method approach using ABINIT code

S. Kaneko, T. Nagano, T. Ito, M. Yasui, T. Ozawa, M. Soga, Y. Motoizumi, H. Funakubo and M. Yoshimoto

Eur. Phys. J. Appl. Phys., 58 1 (2012) 10302

Published online: 23 April 2012

DOI: 10.1051/epjap/2012110247

S. Kaneko

T. Nagano

T. Ito

M. Yasui

T. Ozawa

M. Soga

Y. Motoizumi

H. Funakubo

M. Yoshimoto

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