EPJ

Structural analysis of hydrogenated nanocrystalline silicon thin films as a function of substrate temperature during deposition

Mustafa Anutgan, Sema Uysal and Tamila Anutgan

Eur. Phys. J. Appl. Phys., 65 2 (2014) 20301

Published online: 03 February 2014

DOI: 10.1051/epjap/2013130394

Mustafa Anutgan

Sema Uysal

Tamila Anutgan

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