EPJ

Partial least square regression: an analysis tool for quantitative non-destructive testing

Yann Le Bihan, József Pávó and Claude Marchand

Eur. Phys. J. Appl. Phys., 67 3 (2014) 30901

Published online: 13 August 2014

DOI: 10.1051/epjap/2014130487

Yann Le Bihan

József Pávó

Claude Marchand

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