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Analysis of GaN cap layer effecting on critical voltage for electrical degradation of AlGaN/GaN HEMT

Shenqi Qu, Xiaoliang Wang, Hongling Xiao, Cuimei Wang, Lijuan Jiang, Chun Feng, Hong Chen, Haibo Yin, Junda Yan, Enchao Peng et al. (3 more)

Eur. Phys. J. Appl. Phys., 68 1 (2014) 10105

Published online: 10 October 2014

DOI: 10.1051/epjap/2014140019

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