EPJ

Integration of microwave termination based on TaN thin films on ferrite substrates

Dainan Zhang, Liang Ji and James Kolodzey

Eur. Phys. J. Appl. Phys., 72 1 (2015) 10101

Published online: 04 September 2015

DOI: 10.1051/epjap/2015140497

Dainan Zhang

Liang Ji

James Kolodzey

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