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A new drain current model for amorphous IGZO thin film transistors

Lei Qiang and Ruo-He Yao

Eur. Phys. J. Appl. Phys., 70 1 (2015) 10101

Published online: 21 April 2015

DOI: 10.1051/epjap/2015150032

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Ruo-He Yao

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