EPJ

Charge transient behaviour and spectroscopic ellipsometry characteristics of TiN/HfSiO MOS capacitors

Zeeshan Najam Khan, Ahmed Shuja, Muhammad Ali and Shoaib Alam

Eur. Phys. J. Appl. Phys., 83 1 (2018) 10101

Published online: 18 October 2018

DOI: 10.1051/epjap/2018180104

Zeeshan Najam Khan

Ahmed Shuja

Muhammad Ali

Shoaib Alam

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