EPJ

A comprehensive study of beryllium diffusion in InGaAs using different forms of kick-out mechanism

J. Marcon, S. Koumetz, K. Ketata, M. Ketata and J. G. Caputo

Eur. Phys. J. AP, 8 1 (1999) 7-18

Published online: 15 October 1999

DOI: 10.1051/epjap:1999223

J. Marcon

S. Koumetz

K. Ketata

M. Ketata

J. G. Caputo

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