EPJ

Elaboration and characterization of PNZT thin films deposited on silicon by RF cathodic sputtering

T. Haccart, E. Cattan and D. Rèmiens

Eur. Phys. J. AP, 11 2 (2000) 103-106

Published online: 15 August 2000

DOI: 10.1051/epjap:2000150

T. Haccart

E. Cattan

D. Rèmiens

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