EPJ

Charge stability on thin insulators studied by atomic force microscopy

N. Felidj, J. Lambert, C. Guthmann and M. Saint Jean

Eur. Phys. J. AP, 12 2 (2000) 85-91

Published online: 15 November 2000

DOI: 10.1051/epjap:2000174

N. Felidj

J. Lambert

C. Guthmann

M. Saint Jean

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