EPJ

A virtual non contact-atomic force microscope (NC-AFM): Simulation and comparison with analytical models

G. Couturier, J. P. Aimé, J. Salardenne and R. Boisgard

Eur. Phys. J. AP, 15 2 (2001) 141-147

Published online: 15 August 2001

DOI: 10.1051/epjap:2001175

G. Couturier

J. P. Aimé

J. Salardenne

R. Boisgard

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