EPJ

Study of Ag porous film using X-ray reflectivity and pattern formation using Atomic Force Microscope

S. Banerjee, S. Mukherjee and S. Kundu

Eur. Phys. J. AP, 17 2 (2002) 99-106

Published online: 15 February 2002

DOI: 10.1051/epjap:2002002

S. Banerjee

S. Mukherjee

S. Kundu

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