EPJ

Annealing behaviour of boron implanted defects in Si detector: impact on breakdown performance

S. Chatterji, A. Bhardwaj, K. Ranjan, Namrata, A. K. Srivastava and R. K. Shivpuri

Eur. Phys. J. AP, 17 3 (2002) 223-232

Published online: 15 March 2002

DOI: 10.1051/epjap:2002016

S. Chatterji

A. Bhardwaj

K. Ranjan

Namrata

A. K. Srivastava

R. K. Shivpuri

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