EPJ

Imaging subwavelength holes in chromium films in scanning near-field optical microscopy. Comparison between experiments and calculation

S. Ducourtieux, S. Grésillon, J. C. Rivoal, C. Vannier, C. Bainier, D. Courjon and H. Cory

Eur. Phys. J. Appl. Phys., 26 1 (2004) 35-43

Published online: 04 March 2004

DOI: 10.1051/epjap:2004014

S. Ducourtieux

S. Grésillon

J. C. Rivoal

C. Vannier

C. Bainier

D. Courjon

H. Cory

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