EPJ

EPJ

a
b
c
d
e
ap
st
h
plus
ds
pv
ti
qt
am
n

woc
rnc

From photon emission microscopy to Raman spectroscopy: Failure analysis in microelectronics

I. De Wolf and M. Rasras

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 59-65

Published online: 15 July 2004

DOI: 10.1051/epjap:2004073

This search tool will display articles in Google Scholar database by authors of the selected article:

Select your author(s):

I. De Wolf

M. Rasras

Search method:

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)