EPJ

Investigation of GaAs/AlGaAs interfaces by reflectance-difference spectroscopy

Xiaoling Ye, Y. H. Chen, Bo Xu, Y. P. Zeng and Z. G. Wang

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 297-300

Published online: 15 July 2004

DOI: 10.1051/epjap:2004080

Xiaoling Ye

Y. H. Chen

Bo Xu

Y. P. Zeng

Z. G. Wang

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