EPJ

Light induced contrast in Kelvin Force Microscopy of GaN epilayers

R. Bozek, K. Pakula and J. Baranowski

Eur. Phys. J. Appl. Phys., 27 1-3 (2004) 97-100

Published online: 15 July 2004

DOI: 10.1051/epjap:2004116

R. Bozek

K. Pakula

J. Baranowski

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