EPJ

Temperature measurement in AlGaN/GaN High-Electron-Mobility Transistors using micro-Raman scattering spectroscopy

R. Aubry, C. Dua, J.-C. Jacquet, F. Lemaire, P. Galtier, B. Dessertenne, Y. Cordier, M.-A. DiForte-Poisson and S. L. Delage

Eur. Phys. J. Appl. Phys., 30 2 (2005) 77-82

Published online: 11 March 2005

DOI: 10.1051/epjap:2005025

R. Aubry

C. Dua

J.-C. Jacquet

F. Lemaire

P. Galtier

B. Dessertenne

Y. Cordier

M.-A. DiForte-Poisson

S. L. Delage

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