EPJ

MONOX: a characterization tool for the X-UV range

J.-M. André, A. Avila, R. Barchewitz, R. Benbalagh, R. Delaunay, D. Druart, P. Jonnard and H. Ringuenet
Eur. Phys. J. Appl. Phys., 31 2 (2005) 147-152
Published online: 18 August 2005
DOI: 10.1051/epjap:2005047

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