EPJ

Hall effect sensors integrated in standard technology and optimized with on-chip circuitry

J.-B. Kammerer, L. Hébrard, V. Frick, P. Poure and F. Braun

Eur. Phys. J. Appl. Phys., 36 1 (2006) 49-64

Published online: 06 October 2006

DOI: 10.1051/epjap:2006100

J.-B. Kammerer

L. Hébrard

V. Frick

P. Poure

F. Braun

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