EPJ

Focussing of a transient low energy Cs⁺ probe for improved NanoSIMS characterizations - Study of charged particle optics

M. Bernheim, T. D. Wu, J. L. Guerquin-Kern and A. Croisy

Eur. Phys. J. Appl. Phys., 42 3 (2008) 311-319

Published online: 30 April 2008

DOI: 10.1051/epjap:2008062

M. Bernheim

T. D. Wu

J. L. Guerquin-Kern

A. Croisy

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