EPJ

Phase thickness approach for determination of thin film refractive index dispersion from transmittance spectra

M. R. Nenkov and T. G. Pencheva

Eur. Phys. J. Appl. Phys., 42 3 (2008) 219-228

Published online: 30 April 2008

DOI: 10.1051/epjap:2008067

M. R. Nenkov

T. G. Pencheva

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