EPJ

Compensation of loss to approach –1 effective index by gain in metal-dielectric stacks

J. Zhang, H. Jiang, B. Gralak, S. Enoch, G. Tayeb and M. Lequime

Eur. Phys. J. Appl. Phys., 46 3 (2009) 32603

Published online: 25 July 2008

DOI: 10.1051/epjap:2008148

J. Zhang

H. Jiang

B. Gralak

S. Enoch

G. Tayeb

M. Lequime

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