Microstructural characterization of porous silicon for use in optoelectronic devices D. Abidi, S. Romdhane, A. Brunet-Bruneau and J.-L. Fave Eur. Phys. J. Appl. Phys., 45 1 (2009) 10601 Published online: 14 January 2009 DOI: 10.1051/epjap:2008192