EPJ

Profile characterization of diffraction gratings using angle-resolved polarimetric measurements

M. Foldyna, A. De Martino, C. Licitra, J. Foucher and S. Ben Hatit

EPJ Web of Conferences, 5 (2010) 02003

Published online: 02 June 2010

DOI: 10.1051/epjconf/20100502003

M. Foldyna

A. De Martino

C. Licitra

J. Foucher

S. Ben Hatit

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