EPJ

Inﬂuence of microstructure and internal stress on the mechanical behavior of electroplated gold freestanding thin ﬁlms

J. Martegoutte, C. Seguineau, T. Fourcade, C. Malhaire, P. Martins, J.M. Desmarres and X. Lafontan

EPJ Web of Conferences, 6 (2010) 26009

Published online: 10 June 2010

DOI: 10.1051/epjconf/20100626009

J. Martegoutte

C. Seguineau

T. Fourcade

C. Malhaire

P. Martins

J.M. Desmarres

X. Lafontan

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