EPJ

Anelastic Mechanical Behavior Measurement of thin Films Using Novel Beam deflection Method

C.-J. Tong, K.-S. Hsing and M.-T. Lin

EPJ Web of Conferences, 6 (2010) 40007

Published online: 10 June 2010

DOI: 10.1051/epjconf/20100640007

C.-J. Tong

K.-S. Hsing

M.-T. Lin

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