EPJ

AES, EELS and TRIM simulation method study of InP(100) subjected to Ar⁺, He⁺ and H⁺ ions bombardment.

M. Ghaffour, A. Abdellaoui, M. Bouslama, A. Ouerdane and B. Abidri

EPJ Web of Conferences, 29 (2012) 00020

Published online: 18 June 2012

DOI: 10.1051/epjconf/20122900020

M. Ghaffour

A. Abdellaoui

M. Bouslama

A. Ouerdane

B. Abidri

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