EPJ

HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements

E. Galtier, O. Renner, E. Krouský and F. Rosmej

EPJ Web of Conferences, 59 (2013) 13002

Published online: 15 November 2013

DOI: 10.1051/epjconf/20135913002

E. Galtier

O. Renner

E. Krouský

F. Rosmej

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