EPJ

A new technique for quick identification of defective region inside γ-ray detector

Biswajit Das, R. Palit, A. Kundu, P. Dey, V. Malik, S.K. Jadav, B.S. Naidu and A.T. Vazhappilly

EPJ Web Conf., 288 (2023) 10003

Published online: 21 November 2023

DOI: 10.1051/epjconf/202328810003

Biswajit Das

R. Palit

A. Kundu

P. Dey

V. Malik

S.K. Jadav

B.S. Naidu

A.T. Vazhappilly

Articles written by ALL the selected authors (AND)

Articles written by ANY OF the selected authors (OR)