EPJ

Refractive index and thickness analysis of planar interfaces by prism coupling technique

Paulo Lourenço, Yuri Vygranenko, Miguel Fernandes, Alessandro Fantoni and Manuela Vieira

EPJ Web Conf., 305 (2024) 00023

Published online: 15 October 2024

DOI: 10.1051/epjconf/202430500023

Paulo Lourenço

Yuri Vygranenko

Miguel Fernandes

Alessandro Fantoni

Manuela Vieira

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