Optical Characterisation of Doped Silicon Wafers Using THz Time-Domain Ellipsometry Zahra Mazaheri, Maurizio Casalino, Mario Iodice, Gianpaolo Papari, Roberto Russo and Antonello Andreone EPJ Web Conf., 309 (2024) 09006 Published online: 31 October 2024 DOI: 10.1051/epjconf/202430909006