EPJ

Impact of high-temperature processing steps on the long-term stability of charge carrier lifetime in n-type FZ-silicon

Melanie Mehler, Nicolas Weinert, Nicole Aßmann, Axel Herguth, Giso Hahn and Fabian Geml

EPJ Photovolt., 16 (2025) 15

Published online: 21 February 2025

DOI: 10.1051/epjpv/2025006

Melanie Mehler

Nicolas Weinert

Nicole Aßmann

Axel Herguth

Giso Hahn

Fabian Geml

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